A new and advanced automated X-ray Diffraction system has been introduced by Rigaku Americas of The Woodlands specifically aimed at nanomaterials research. In this system a horizontal sample mount is combined with patented Cross Beam Optic technology. With these researchers working in the field of nanomaterials research would get a wide range of X-ray diffraction measurements.
Dubbed as the SmartLab NANO-Extreme, this device is meant for a number of applications which includes glancing incidence diffraction, nanomaterial identification in bulk and small angle X-ray scattering.
Besides this the company is also introducing a MiniFlex II benchtop X-ray diffraction system and Nanohunter benchtoptop total reflection X-ray fluorescence spectrometer.
